Centre de Recherches et des Technologies de l’Energie (CRTEn), Technopole de Borj-Cédria (www.crten.rnrt.tn), BP. 95, 2050 Hammam-Lif, TUNISIE
Thèse de doctorat en Physique, Juin 2007, FST,
Diplôme d’études approfondies en Physique, spécialité Physique Quantique, Novembre 2001, FST.
Maîtrise en Sciences Physiques en 1999, FST.
Physique des semi-conducteurs
Les cellules photovoltaïques au silicium cristallin
Surfaces et interfaces
Synthèse et caractérisations des nanomatériaux
Publications
1. Light induced enhancement of minority carrier lifetime of chemically passivated crystalline silicon, S. Aouida, N. Bachtouli, B. Bessais, Applied Surface Science 274 (2013) 255–257.
2. Hydrogen passivation of silicon nanowire structures, S. Aouida, R. Benabderrahmanezaghouani, N. Bachtouli, B. Bessais, , Applied Surface Science Volume 370, 1 May 2016, Pages 49–52.
2. Silicon Vapor-Etching Provide Thin SiOx/Si/SiOx Structures, Selma Aouida, Nessima Ennajeh, Nesrine Bachtouli and Brahim Bessais, J. Chem. Eng. Chem. Res. Vol. 2, No. 3, 2015, pp. 536-539.
3. Effective minority carrier lifetime measured in QSS mode and silicon surface treatments, Selma Aouida, Rabia Benabderrahmane Zaghouani, Nesrine Bachtouli, Brahim Bessais, 31st European Photovoltaic Solar Energy Conference and Exhibition Septembre 2015, conference paper, pp. 835-837.
4. Implications of alkaline solutions-induced etching on optical and minority carrier lifetime features of monocrystalline silicon, N. Bachtouli, S. Aouida, R. Hadj Laajimi, M.F. Boujmil, B. Bessais; Applied Surface Science 258 (2012) 8889–8894.
5. Formation mechanism of porous silicon nanowires in HF/AgNO3 solution, N. Bachtouli, S. Aouida, B. Bessais, Microporous and Mesoporous Materials 187 (2014) 82–85.
6. Progress of porous silicon APTES-functionalization by FTIR investigations, N. Majoul, S. Aouida, B. Bssais, Applied Surface Science 331 (2015) 388–391.
7. Silver Nanoparticles Effect on Silicon Nanowires Properties, R. Benabderrahmane Zaghouani, S. Aouida, N. Bachtouli, B. Bessais, Chemistry Journal Vol. 1, No. 2, 2015, pp. 10-14.
8. Ultra thin porous silicon films investigated by X-ray reflectometry, Nessima Ennejah, Selma Aouida, and Brahim Bessais, Phys. Status Solidi C 8, No. 6, 1931–1935 (2011).